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DJPS

Diyala Journal For Pure Science

Scientific Refereed Journal Published By College of Science - University of Diyala

 

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Diyala Journal For Pure Sciences DJPS

ISRA Impact Factor:3.715

P- ISSN:2222-8373, E-ISSN:2518-9255

Volume 14, Issue 1, Part 1 , Januar y. 2018

 

 

Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer

 Ammar T. Salih, Kadhim R. Gbashi and Tawfeeq Kadhem Salman

Year: 2018, Volume: 14, Issue: 1, Part:1

Pages: 68-77 , DOI: http://dx.doi.org/10.24237/djps.1401.331C 

Language: English

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Abstract


 

Uniform layers of SiO2 were prepared using thermal evaporation technique under high vacuum (10-5 mbar). Many characterizations were investigated using these films as antireflective layers. The morphological, crystal structural and optical properties of the layers were investigated by using SEM, XRD, and UV-Vis instruments.

 

Keywordsthin films, thermal evaporation, SiO2, antireflection.

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